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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.156 >

フォトルミネセンス法によるInGaAs表面の評価

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/42291

Title: フォトルミネセンス法によるInGaAs表面の評価
Other Titles: Characterization of InGaAs Surface by Photoluminescence
Authors: 岩舘, 弘剛1 Browse this author
斉藤, 俊也2 Browse this author
長谷川, 英機3 Browse this author
Authors(alt): Iwadate, H.1
Saitoh, T.2
Hasegawa, H.3
Issue Date: 20-Jul-1991
Publisher: 北海道大学
Journal Title: 北海道大學工學部研究報告
Journal Title(alt): Bulletin of the Faculty of Engineering, Hokkaido University
Volume: 156
Start Page: 59
End Page: 66
Type: bulletin (article)
URI: http://hdl.handle.net/2115/42291
Appears in Collections:北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.156

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