フォトルミネセンス法によるInGaAS細線の評価


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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/42431

Title:	フォトルミネセンス法によるInGaAS細線の評価
Other Titles:	Charactorization of InGaAs Wires by Photoluminescence
Authors:	岩穴, 忠義¹ Browse this author
	藤倉, 序章² Browse this author
	長谷川, 英機³ Browse this author
Authors(alt):	Iwa-ana, Tadayoshi¹
	Fujikura, Hajime²
	Hasegawa, Hideki³
Issue Date:	29-Jul-1994
Publisher:	北海道大学
Journal Title:	北海道大學工學部研究報告
Journal Title(alt):	Bulletin of the Faculty of Engineering, Hokkaido University
Volume:	170
Start Page:	17
End Page:	26
Type:	bulletin (article)
URI:	http://hdl.handle.net/2115/42431
Appears in Collections:	北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.170

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