HUSCAP logo Hokkaido Univ. logo

Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.175 >

レーザーフラッシュ法による熱伝導率データの信頼性におよぼす試験片の状態の影響

Files in This Item:
175_97-106.pdf677.06 kBPDFView/Open
Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/42458

Title: レーザーフラッシュ法による熱伝導率データの信頼性におよぼす試験片の状態の影響
Other Titles: Effects of Sample Conditions on the Reliability of Thermal Conductivity Data taken by the Laser-flash Method
Authors: 大久保, 賢二1 Browse this author
寺田, 芳弘2 Browse this author
毛利, 哲雄3 Browse this author →KAKEN DB
鈴木, 朝夫4 Browse this author
Authors(alt): Ohkubo, Kenji1
Terada, Yoshihiro2
Mohri, Tetsuo3
Suzuki, Tomoo4
Issue Date: 31-Oct-1995
Publisher: 北海道大学
Journal Title: 北海道大學工學部研究報告
Journal Title(alt): Bulletin of the Faculty of Engineering, Hokkaido University
Volume: 175
Start Page: 97
End Page: 106
Type: bulletin (article)
URI: http://hdl.handle.net/2115/42458
Appears in Collections:北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.175

Export metadata:

OAI-PMH ( junii2 , jpcoar_1.0 )

MathJax is now OFF:


 

 - Hokkaido University