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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.175 >
レーザーフラッシュ法による熱伝導率データの信頼性におよぼす試験片の状態の影響
Title: | レーザーフラッシュ法による熱伝導率データの信頼性におよぼす試験片の状態の影響 |
Other Titles: | Effects of Sample Conditions on the Reliability of Thermal Conductivity Data taken by the Laser-flash Method |
Authors: | 大久保, 賢二1 Browse this author | 寺田, 芳弘2 Browse this author | 毛利, 哲雄3 Browse this author →KAKEN DB | 鈴木, 朝夫4 Browse this author |
Authors(alt): | Ohkubo, Kenji1 | Terada, Yoshihiro2 | Mohri, Tetsuo3 | Suzuki, Tomoo4 |
Issue Date: | 31-Oct-1995 |
Publisher: | 北海道大学 |
Journal Title: | 北海道大學工學部研究報告 |
Journal Title(alt): | Bulletin of the Faculty of Engineering, Hokkaido University |
Volume: | 175 |
Start Page: | 97 |
End Page: | 106 |
Type: | bulletin (article) |
URI: | http://hdl.handle.net/2115/42458 |
Appears in Collections: | 北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.175
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