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Analysis of experimental error sources in a linear-optics quantum gate

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Title: Analysis of experimental error sources in a linear-optics quantum gate
Authors: Nagata, T. Browse this author
Okamoto, R. Browse this author
Hofmann, H. F. Browse this author
Takeuchi, S. Browse this author →KAKEN DB
Issue Date: Apr-2010
Publisher: Institute of Physics and Deutsche Physikalische Gesellschaft e.V.
Journal Title: New Journal of Physics
Volume: 12
Start Page: 043053
Publisher DOI: 10.1088/1367-2630/12/4/043053
Abstract: Possible error sources in an experimentally realized linear-optics controlled-Z gate (Okamoto et al 2005 Phys. Rev. Lett. 95 210506) are analyzed by considering the deviations of the beam splitting ratios from the ideal values (δRH, δRV), the polarization-dependent phase shift (birefringence) of the optical components (δφ) and the mode mismatch of input photons (δξ). It is found that the error rate is linearly dependent on δRV and δξ, while the dependence on δRH and δφ is approximately quadratic. As a practical result, the gate is much more sensitive to small errors in RV than in RH. Specifically, the reflectivity error for vertical polarization must be less than 0.1% to realize a gate with an error of less than 0.1%, whereas the reflectivity error for horizontal polarization can be up to 1%. It is also shown that the effects of different error sources are not independent of each other (linear error model). Under certain conditions, the deviation from the linear error model exceeds 10% of the total error. The method of analysis used illustrates the basic features of errors in general linear optics quantum gates and circuits, and can easily be adapted to any other device of this type.
Rights: © 2010 IOP Publishing Ltd and Deutsche Physikalische Gesellschaft
Type: article
Appears in Collections:電子科学研究所 (Research Institute for Electronic Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 竹内 繁樹

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