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Deep Level Characterization of GaAs and AlGaAs by Capacitance Spectroscopy

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Please use this identifier to cite or link to this item:http://doi.org/10.11501/2964274

Title: Deep Level Characterization of GaAs and AlGaAs by Capacitance Spectroscopy
Other Titles: 容量分光法によるGaAsおよびAlGaAsの深い準位の評価
Authors: Hashizume, Tamotsu1 Browse this author →KAKEN DB
Authors(alt): 橋詰, 保1
Issue Date: 25-Mar-1991
Conffering University: 北海道大学
Degree Report Number: 乙第3905号
Degree Level: 博士
Degree Discipline: 工学
Type: theses (doctoral)
URI: http://hdl.handle.net/2115/51156
Appears in Collections:学位論文 (Theses) > 博士 (工学)

Submitter: 橋詰 保

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