Deep Level Characterization of GaAs and AlGaAs by Capacitance Spectroscopy


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Please use this identifier to cite or link to this item:http://doi.org/10.11501/2964274

Title:	Deep Level Characterization of GaAs and AlGaAs by Capacitance Spectroscopy
Other Titles:	容量分光法によるGaAsおよびAlGaAsの深い準位の評価
Authors:	Hashizume, Tamotsu¹ Browse this author →KAKEN DB
Authors(alt):	橋詰, 保¹
Issue Date:	25-Mar-1991
Conffering University:	北海道大学
Degree Report Number:	乙第3905号
Degree Level:	博士
Degree Discipline:	工学
Type:	theses (doctoral)
URI:	http://hdl.handle.net/2115/51156
Appears in Collections:	学位論文 (Theses) > 博士　（工学）

Submitter: 橋詰保

OAI-PMH ( junii2 , jpcoar_1.0 )

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