Title: | Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser |
Authors: | Tanaka, Yoshihito Browse this author |
Ito, Kiminori Browse this author |
Nakatani, Takashi Browse this author |
Onitsuka, Rena Browse this author |
Newton, Marcus Browse this author →KAKEN DB |
Sato, Takahiro Browse this author |
Togashi, Tadashi Browse this author |
Yabashi, Makina Browse this author |
Kawaguchi, Tomoya Browse this author |
Shimada, Koki Browse this author |
Tokuda, Kazuya Browse this author |
Takahashi, Isao Browse this author |
Ichitsubo, Tetsu Browse this author |
Matsubara, Eiichiro Browse this author |
Nishino, Yoshinori Browse this author →KAKEN DB |
Keywords: | Coherent X-ray diffraction |
Time-resolved measurement |
X-ray free electron laser |
Semiconductor |
Nanocrystal |
Issue Date: | 1-Mar-2013 |
Publisher: | The Ceramic Society of Japan |
Journal Title: | Journal of the Ceramic Society of Japan |
Volume: | 121 |
Issue: | 1411 |
Start Page: | 283 |
End Page: | 286 |
Abstract: | Ultrafast time-resolved Bragg coherent X-ray diffraction (CXD) has been performed to investigate lattice dynamics in a thin crystal layer with a nanoscale thickness by using a SASE (Self-Amplified Spontaneous Emission)-XFEL (X-ray Free Electron Laser) facility, SACLA. Single-shot Bragg coherent diffraction patterns of a 100 nm-thick silicon crystal were measured in the asymmetric configuration with a grazing exit using an area detector. The measured coherent diffraction patterns showed fringes extending in the surface normal direction. By using an optical femtosecond laser-pump and the XFEL-probe, a transient broadening of coherent diffraction pattern profile was observed at a delay time of around a few tens of picosecond, indicating transient crystal lattice fluctuation induced by the optical laser. A perspective application of the time-resolved Bragg CXD method to investigate small sized grains composing ceramic materials is discussed. (C)2013 The Ceramic Society of Japan. All rights reserved. |
Type: | article |
URI: | http://hdl.handle.net/2115/52780 |
Appears in Collections: | 電子科学研究所 (Research Institute for Electronic Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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