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In situ Determination of Surface Tension-to-Shear Viscosity Ratio for Quasiliquid Layers on Ice Crystal Surfaces

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Title: In situ Determination of Surface Tension-to-Shear Viscosity Ratio for Quasiliquid Layers on Ice Crystal Surfaces
Authors: Murata, Ken-ichiro Browse this author
Asakawa, Harutoshi Browse this author
Nagashima, Ken Browse this author
Furukawa, Yoshinori Browse this author
Sazaki, Gen Browse this author
Issue Date: 18-Dec-2015
Publisher: American Physical Society (APS)
Journal Title: Physical review letters
Volume: 115
Start Page: 256103-1
End Page: 256103-5
Publisher DOI: 10.1103/PhysRevLett.115.256103
PMID: 26722929
Abstract: We have experimentally determined the surface tension-to-shear viscosity ratio (the so-called characteristic velocity) of quasiliquid layers (QLLs) on ice crystal surfaces from their wetting dynamics. Using an advanced optical microscope, whose resolution reaches the molecular level in the height direction, we directly observed the coalescent process of QLLs and followed the relaxation modes of their contact lines. The relaxation dynamics is known to be governed by the characteristic velocity, which allows us to access the physical properties of QLLs in a noninvasive way. Here we quantitatively demonstrate that QLLs, when completely wetting ices, have a thickness of 9 +/- 3 nm and an approximately 200 times lower characteristic velocity than bulk water, whereas QLLs, when partially wetting ices, have a velocity that is 20 times lower than the bulk. This indicates that ice crystal surfaces significantly affect the physical properties of QLLs localized near the surfaces at a nanometer scale.
Rights: ©2015 American Physical Society
Type: article
Appears in Collections:低温科学研究所 (Institute of Low Temperature Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 村田 憲一郎

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