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Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy

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タイトル: Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy
著者: Watanabe, Yoshihide 著作を一覧する
Nishimura, Yusaku F. 著作を一覧する
Suzuki, Ryo 著作を一覧する
Uehara, Hiromitsu 著作を一覧する
Nimura, Tomoyuki 著作を一覧する
Beniya, Atsushi 著作を一覧する
Isomura, Noritake 著作を一覧する
Asakura, Kiyotaka 著作を一覧する
Takakusagi, Satoru 著作を一覧する
発行日: 2016年 3月
出版者: American Institute of Physics
誌名: Journal of Vacuum Science & Technology A
巻: 34
号: 2
開始ページ: 023201
出版社 DOI: 10.1116/1.4936344
抄録: A portable ultrahigh-vacuum sample storage system was designed and built to investigate the detailed geometric structures of mass-selected metal clusters on oxide substrates by polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy (PTRF-XAFS). This ultrahigh-vacuum (UHV) sample storage system provides the handover of samples between two different sample manipulating systems. The sample storage system is adaptable for public transportation, facilitating experiments using air-sensitive samples in synchrotron radiation or other quantum beam facilities. The samples were transferred by the developed portable UHV transfer system via a public transportation at a distance over 400 km. The performance of the transfer system was demonstrated by a successful PTRF-XAFS study of Pt-4 clusters deposited on a TiO2(110) surface.
Rights: (C) 2015 American Vacuum Society. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.The following article appeared in Journal of Vacuum Science & Technology A 34, 023201 (2016) and may be found at http://scitation.aip.org/content/avs/journal/jvsta/34/2/10.1116/1.4936344.
資料タイプ: article
URI: http://hdl.handle.net/2115/64612
出現コレクション:雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

提供者: 高草木 達

 

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