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Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/64612

Title: Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy
Authors: Watanabe, Yoshihide Browse this author
Nishimura, Yusaku F. Browse this author
Suzuki, Ryo Browse this author
Uehara, Hiromitsu Browse this author
Nimura, Tomoyuki Browse this author
Beniya, Atsushi Browse this author
Isomura, Noritake Browse this author
Asakura, Kiyotaka Browse this author →KAKEN DB
Takakusagi, Satoru Browse this author →KAKEN DB
Issue Date: Mar-2016
Publisher: American Institute of Physics
Journal Title: Journal of Vacuum Science & Technology A
Volume: 34
Issue: 2
Start Page: 023201
Publisher DOI: 10.1116/1.4936344
Abstract: A portable ultrahigh-vacuum sample storage system was designed and built to investigate the detailed geometric structures of mass-selected metal clusters on oxide substrates by polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy (PTRF-XAFS). This ultrahigh-vacuum (UHV) sample storage system provides the handover of samples between two different sample manipulating systems. The sample storage system is adaptable for public transportation, facilitating experiments using air-sensitive samples in synchrotron radiation or other quantum beam facilities. The samples were transferred by the developed portable UHV transfer system via a public transportation at a distance over 400 km. The performance of the transfer system was demonstrated by a successful PTRF-XAFS study of Pt-4 clusters deposited on a TiO2(110) surface.
Rights: (C) 2015 American Vacuum Society. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.The following article appeared in Journal of Vacuum Science & Technology A 34, 023201 (2016) and may be found at http://scitation.aip.org/content/avs/journal/jvsta/34/2/10.1116/1.4936344.
Type: article
URI: http://hdl.handle.net/2115/64612
Appears in Collections:触媒科学研究所 (Institute for Catalysis) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 高草木 達

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