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Double threshold behavior in a resonance-controlled ZnO random laser

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Title: Double threshold behavior in a resonance-controlled ZnO random laser
Authors: Niyuki, Ryo Browse this author
Fujiwara, Hideki Browse this author →KAKEN DB
Nakamura, Toshihiro Browse this author
Ishikawa, Yoshie Browse this author
Koshizaki, Naoto Browse this author
Tsuji, Takeshi Browse this author
Sasaki, Keiji Browse this author →KAKEN DB
Issue Date: Mar-2017
Publisher: American Institute of Physics (AIP)
Journal Title: Apl photonics
Volume: 2
Issue: 3
Start Page: 36101
Publisher DOI: 10.1063/1.4974334
Abstract: We observed unusual lasing characteristics, such as double thresholds and blue-shift of lasing peak, in a resonance-controlled ZnO random laser. From the analysis of lasing threshold carrier density, we found that the lasing at 1st and 2nd thresholds possibly arises from different mechanisms; the lasing at 1st threshold involves exciton recombination, whereas the lasing at 2nd threshold is caused by electron-hole plasma recombination, which is the typical origin of conventional random lasers. These phenomena are very similar to the transition from polariton lasing to photon lasing observed in a well-defined cavity laser.
Rights: Copyright 2017 Author(s). This article is distributed under a Creative Commons Attribution (CC BY) License.
Type: article
Appears in Collections:電子科学研究所 (Research Institute for Electronic Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 藤原 英樹

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