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Remote excitation-tip-enhanced Raman scattering microscopy using silver nanowire

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Title: Remote excitation-tip-enhanced Raman scattering microscopy using silver nanowire
Authors: Fujita, Yasuhiko Browse this author
Walke, Peter Browse this author
De Feyter, Steven Browse this author
Uji-i, Hiroshi Browse this author →KAKEN DB
Issue Date: Aug-2016
Publisher: IOP Publishing
Journal Title: Japanese Journal of Applied Physics (JJAP)
Volume: 55
Issue: 8S1
Start Page: 08NB03
Publisher DOI: 10.7567/JJAP.55.08NB03
Abstract: Tip-enhanced Raman scattering (TERS) microscopy is a promising technique for use in surface analysis, allowing both topographic and spectroscopic information to be obtained simultaneously at a scale below 10 nm. One proposed method to further improve spatial resolution is the use of propagating surface plasmons as an excitation light source (i.e.,remote excitation). However, this requires a specialized tip that can only be fabricated via expensive procedures, such as electron-beam lithography. Here, we propose a new method for fabricating silver nanowire-based tips that are suitable for remote excitation-TERS, removing the need for such techniques. A silver nanowire was fixed onto a tungsten-tip using a micromanipulator, before gold nanoparticles were attached in a site-specific manner using AC-dielectrophoresis. All the processes were completed using an optical microscope in the ambient. The background intensities in TERS spectra were suppressed with remote excitation relative to the conventional excitation configuration, indicating an increase in TERS sensitivity.
Rights: © 2016 The Japan Society of Applied Physics
Type: article (author version)
Appears in Collections:電子科学研究所 (Research Institute for Electronic Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 雲林院 宏

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