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Evidence for Multi-Atom Resonance X-ray Raman Spectroscopy : An in situ Low Z-element and Bond-specific X-ray Spectroscopy
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Title: | Evidence for Multi-Atom Resonance X-ray Raman Spectroscopy : An in situ Low Z-element and Bond-specific X-ray Spectroscopy |
Authors: | Sirisit, Natee Browse this author | Kido, Daiki Browse this author | Wakisaka, Yuki Browse this author | Ariga-Miwa, Hiroko Browse this author →KAKEN DB | Takakusagi, Satoru Browse this author →KAKEN DB | Asakura, Kiyotaka Browse this author →KAKEN DB | Sekizawa, Oki Browse this author | Sakata, Tomohiro Browse this author | Uruga, Tomoya Browse this author | Iwasawa, Yasuhiro Browse this author |
Keywords: | X-ray absorption fine structure | XAFS | Multi-atom resonance | In situ | Synchrotron radiation |
Issue Date: | 2018 |
Publisher: | The Japan Society of Vacuum and Surface Science |
Journal Title: | e-Journal of Surface Science and Nanotechnology |
Volume: | 16 |
Start Page: | 387 |
End Page: | 390 |
Publisher DOI: | 10.1380/ejssnt.2018.387 |
Abstract: | We have shown a possibility of multi-atom resonant X-ray Raman (MARX-Raman) spectroscopy by measuring the N K-edge loss spectrum of TaN at Ta L3-edge and C K-edge loss spectrum of Er(C5H5)3 at Er L1-edge. When the excitation X-ray energy was tuned to the Ta L3-edge and inelastic scattering spectra were recorded around 400 eV loss corresponding to the N K-edge Raman region, we found a clear enhancement of emission spectrum. The same enhancement was observed in C K-edge Raman region in Er(C5H5)3. These experimental results have indicated the possibility of MARX-Raman phenomenon which may lead to a new in situ and bond-speci_c XAFS spectroscopy for low Z elements. |
Rights: | © 2018 The Japan Society of Vacuum and Surface Science | https://creativecommons.org/licenses/by/4.0/ |
Type: | article |
URI: | http://hdl.handle.net/2115/71471 |
Appears in Collections: | 触媒科学研究所 (Institute for Catalysis) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 朝倉 清高
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