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Development of Surface Fluorescence X‐Ray Absorption Fine Structure Spectroscopy Using a Laue‐Type Monochromator
Title: | Development of Surface Fluorescence X‐Ray Absorption Fine Structure Spectroscopy Using a Laue‐Type Monochromator |
Authors: | Wakisaka, Yuki Browse this author | Kido, Daiki Browse this author | Uehara, Hiromitsu Browse this author | Yuan, Qiuyi Browse this author | Feiten, Felix E. Browse this author | Mukai, Shingo Browse this author | Takakusagi, Satoru Browse this author →KAKEN DB | Uemura, Yohei Browse this author | Yokoyama, Toshihiko Browse this author | Wada, Takahiro Browse this author | Uo, Motohiro Browse this author | Sekizawa, Oki Browse this author | Uruga, Tomoya Browse this author | Iwasawa, Yasuhiro Browse this author | Asakura, Kiyotaka Browse this author →KAKEN DB |
Issue Date: | Jul-2019 |
Publisher: | Wiley-Blackwell |
Journal Title: | The Chemical Record |
Volume: | 19 |
Issue: | 7 |
Start Page: | 1157 |
End Page: | 1165 |
Publisher DOI: | 10.1002/tcr.201800020 |
Abstract: | Surface fluorescence X-ray absorption fine structure (XAFS) spectroscopy using a Laue-type monochromator has been developed to acquire structural information about metals with a very low concentrate on a flat highly oriented pyrolytic graphite (HOPG) surface in the presence of electrolytes. Generally, surface fluorescence XAFS spectroscopy is hindered by strong scattering from the bulk, which often chokes the pulse counting detector. In this work, we show that a bent crystal Laue analyzer (BCLA) can efficiently remove the scattered X-rays from the bulk even in the presence of solution. We applied the technique to submonolayer (similar to 10(14) atoms cm(-2)) Pt on HOPG and successfully obtained high signal/noise in situ XAFS data in combination with back-illuminated fluorescence XAFS (BI-FXAFS) spectroscopy. This technique allows in situ XAFS measurements of flat electrode surfaces to be performed in the presence of electrolytes. |
Rights: | This is the peer reviewed version of the following article: Y. Wakisaka, D. Kido, H. Uehara, Q. Yuan, F. E. Feiten, S. Mukai, S. Takakusagi, Y. Uemura, T. Yokoyama, T. Wada, M. Uo, O. Sekizawa, T. Uruga, Y. Iwasawa, K. Asakura, Chem. Rec. 2019, 19, 1157, which has been published in final form at https://doi.org/10.1002/tcr.201800020 . This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. |
Type: | article (author version) |
URI: | http://hdl.handle.net/2115/78813 |
Appears in Collections: | 触媒科学研究所 (Institute for Catalysis) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 朝倉 清高
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