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An oxide-based flexible electrochromic transistor under mechanical stress

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Title: An oxide-based flexible electrochromic transistor under mechanical stress
Authors: Onozato, Takaki Browse this author
Cho, Hai Jun Browse this author
Ohta, Hiromichi Browse this author →KAKEN DB
Issue Date: 1-Feb-2020
Publisher: IOP Publishing
Journal Title: Japanese Journal of Applied Physics (JJAP)
Volume: 59
Issue: 2
Start Page: 024002
Publisher DOI: 10.7567/1347-4065/ab6563
Abstract: Today mechanical flexibility has become an important feature for electronic devices, especially in flat display panels. Here we demonstrate the device operation of a tungsten oxide-based flexible electrochromic transistor (ECT), which was fabricated on 0.1 mm thick polyethylene terephthalate film. The ECT can be operated by applying voltage of 3 V for 1 s when the radius of curvature was larger than 16 mm, indicating that the flexible ECT exhibited a strong resistance to static strains. However, the resistance of the channel increased by fatigues from applying cyclic flexural strains. Present flexible ECT would highly be useful for the economically viable curved display panels. However, its vulnerability to fatigue needs improvements for other applications.
Rights: © 2020 The Japan Society of Applied Physics
Type: article (author version)
Appears in Collections:電子科学研究所 (Research Institute for Electronic Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 太田 裕道

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