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Near-Field Imaging and Time-Domain Dynamics of Photonic Topological Edge States in Plasmonic Nanochains
Title: | Near-Field Imaging and Time-Domain Dynamics of Photonic Topological Edge States in Plasmonic Nanochains |
Authors: | Yan, Qiuchen Browse this author | Cao, En Browse this author | Sun, Quan Browse this author →KAKEN DB | Ao, Yutian Browse this author | Hu, Xiaoyong Browse this author | Shi, Xu Browse this author →KAKEN DB | Gong, Qihuang Browse this author | Misawa, Hiroaki Browse this author →KAKEN DB |
Keywords: | topological photonics | plasmonic nanochain | photoemission electron microscopy | ultrafast optics | nanofemto scale |
Issue Date: | 10-Nov-2021 |
Publisher: | American Chemical Society |
Journal Title: | Nano letters |
Volume: | 21 |
Issue: | 21 |
Start Page: | 9270 |
End Page: | 9278 |
Publisher DOI: | 10.1021/acs.nanolett.1c03324 |
Abstract: | Time-domain dynamic evolution properties of topological states play an important role in both fundamental physics study and practical applications of topological photonics. However, owing to the absence of available ultrafast time-domain dynamic characterization methods, studies have mostly focused on the frequency-domain-based properties, and there are few reports demonstrating the time-domain-based properties. Here, we measured the dynamic near-field responses of plasmonic topological structures of gold nanochains with the configuration of the Su-Schrieffer-Heeger model by using ultrahigh spatial-temporal resolution photoemission electron microscopy. The dephasing time of plasmonic topological edge states increases with increasing the bulk lattice number that has a threshold requirement and finally reaches saturation. We directly revealed through simulation that there is a transient bulk state in the evolution of topological edge states, that is, the energy undergoes relaxation from oscillation between the bulk lattice and the edge. This work shows a new perspective of time-domain dynamic topological photonics. |
Type: | article |
URI: | http://hdl.handle.net/2115/83640 |
Appears in Collections: | 電子科学研究所 (Research Institute for Electronic Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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