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TypeAuthor(s)TitleOther TitlesCitationCitation(alt)Issue Date
bulletin (article)高橋, 平七郎; 柴山, 環樹; 長谷川, 英樹; 大野, 英男高分解能電子顕微鏡による化合物半導体/酸化絶縁膜界面構造の観察Observation of Interfaces of Compound Semiconductors by High Resolution Electron Microscope北海道大學工學部研究報告Bulletin of the Faculty of Engineering, Hokkaido University30-Sep-1988
theses (doctoral)柴山, 環樹高分解能電子顕微鏡法による半導体界面の微細構造解析に関する研究---25-Mar-1992
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