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bulletin (article)
高橋, 平七郎
;
柴山, 環樹
;
長谷川, 英樹
;
大野, 英男
高分解能電子顕微鏡による化合物半導体/酸化絶縁膜界面構造の観察
Observation of Interfaces of Compound Semiconductors by High Resolution Electron Microscope
北海道大學工學部研究報告
Bulletin of the Faculty of Engineering, Hokkaido University
30-Sep-1988
theses (doctoral)
柴山, 環樹
高分解能電子顕微鏡法による半導体界面の微細構造解析に関する研究
-
-
-
25-Mar-1992
Showing results 1 to 2 of 2
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