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TypeAuthor(s)TitleOther TitlesCitationCitation(alt)Issue Date
articleUeno, Ken; Hirose, Tetsuya; Asai, Tetsuya; Amemiya, YoshihitoA 300 nW, 15 ppm/℃, 20 ppm/V CMOS Voltage Reference Circuit Consisting of Subthreshold MOSFETsA 300 nW, 15 ppm/degC, 20 ppm/V CMOS Voltage Reference Circuit Consisting of Subthreshold MOSFETsIEEE Journal of Solid-State Circuits-Jul-2009
articleSasaki, M.; Fujiwara, M.; Ishizuka, H.; Klaus, W.; Wakui, K.; Takeoka, M.; Miki, S.; Yamashita, T.; Wang, Z.; Tanaka, A.; Yoshino, K.; Nambu, Y.; Takahashi, S.; Tajima, A.; Tomita, A.; Domeki, T.; Hasegawa, T.; Sakai, Y.; Kobayashi, H.; Asai, T.; Shimizu, K.; Tokura, T.; Tsurumaru, T.; Matsui, M.; Honjo, T.; Tamaki, K.; Takesue, H.; Tokura, Y.; Dynes, J. F.; Dixon, A. R.; Sharpe, A. W.; Yuan, Z. L.; Shields, A. J.; Uchikoga, S.; Legré, M.; Robyr, S.; Trinkler, P.; Monat, L.; Page, J.-B.; Ribordy, G.; Poppe, A.; Allacher, A.; Maurhart, O.; Länger, T.; Peev, M.; Zeilinger, A.Field test of quantum key distribution in the Tokyo QKD Network-Optics Express-23-May-2011
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