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TypeAuthor(s)TitleOther TitlesCitationCitation(alt)Issue Date
article (author version)Hashizume, Tamotsu; Kotani, Junji; Basile, Alberto; Kaneko, MasamitsuSurface Control Process of AlGaN for Suppression of Gate Leakage Currents in AlGaN/GaN Heterostructure Field Effect Transistors-Japanese Journal of Applied Physics. Pt. 2, Letters & express letters-Feb-2006
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