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article (author version)Fu, Zhengwen; Takahashi, Hiroshi; Kasai, Seiya; Hasegawa, HidekiOptimization and Interface Characterization of a Novel Oxide-Free Insulated Gate Structure for InP Having an Ultrathin Silicon Interface Control Layer-Japanese Journal of Applied Physics. Pt. 1, Regular papers, short notes & review papers-Feb-2002
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