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TypeAuthor(s)TitleOther TitlesCitationCitation(alt)Issue Date
articleMatsumoto, Chizu; Hamamura, Yuichi; Nakao, Michinobu; Yamasaki, Kaname; Saito, Yoshikazu; Kaneko, Shun'ichiNovel Fuse Scheme with a Short Repair Time to Maximize Good Chips per Wafer in Advanced SoCs-IEICE Transactions on Electronics-1-Jan-2013
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