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Hokkaido University Collection of Scholarly and Academic Papers
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article
Akazawa, Masamichi
;
Yokota, Naoshige
;
Uetake, Kei
Detection of deep-level defects and reduced carrier concentration in Mg-ion-implanted GaN before high-temperature annealing
-
AIP Advances
-
Feb-2018
article (author version)
Akazawa, Masamichi
;
Uetake, Kei
Impact of low-temperature annealing on defect levels generated by Mg-ion-implanted GaN
-
Japanese Journal of Applied Physics (JJAP)
-
1-Jun-2019
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