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Structural and magnetic properties of epitaxially grown full-Heusler alloy Co2MnGe thin films deposited using magnetron sputtering

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Title: Structural and magnetic properties of epitaxially grown full-Heusler alloy Co2MnGe thin films deposited using magnetron sputtering
Authors: Ishikawa, Takayuki Browse this author
Marukame, Takao Browse this author
Matsuda, Ken-ichi Browse this author →KAKEN DB
Uemura, Tetsuya Browse this author →KAKEN DB
Arita, Masashi Browse this author →KAKEN DB
Yamamoto, Masafumi Browse this author →KAKEN DB
Issue Date: 15-Apr-2006
Publisher: American Institute of Physics
Journal Title: Journal of applied physics
Volume: 99
Issue: 8
Start Page: 08J110-1
End Page: 08J110-3
Publisher DOI: 10.1063/1.1270980
Abstract: Full-Heusler alloy Co2MnGe thin films were epitaxially grown on MgO (001) substrates using magnetron sputtering. The films were deposited at room temperature and subsequently annealed in situ at temperatures ranging from 400 to 600 degrees C. X-ray pole figure measurements for the annealed films showed (111) peaks with fourfold symmetry, which gives direct evidence that these films are epitaxial and crystallized in the L2(1) structure. Furthermore, cross-sectional transmission electron microscope images of a fabricated film indicated that it is single crystalline. The annealed films had sufficiently flat surface morphologies with roughnesses of about 0.26 nm rms at film thicknesses of 45 nm. The saturation magnetization of the annealed films was 4.49 mu(B)/f.u. at 10 K, corresponding to about 90% of the Slater-Pauling value for Co2MnGe.
Rights: (C) 2006 American Institute of Physics.
Relation: http://jap.aip.org/jap/top.jsp
Type: article
URI: http://hdl.handle.net/2115/13461
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 石川 貴之

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