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Conductance measurements of nanoscale regions with in situ transmission electron microscopy

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Title: Conductance measurements of nanoscale regions with in situ transmission electron microscopy
Authors: Arita, Masashi Browse this author →KAKEN DB
Hirose, Ryusuke Browse this author
Hamada, Kouichi Browse this author
Takahashi, Yasuo Browse this author
Keywords: transmission electron microscopy
scanning tunnelling spectroscopy
SrF2
Fe-SrF2 granular film
Coulomb staircase
Issue Date: Jun-2006
Publisher: Elsevier
Journal Title: Materials Science and Engineering: C
Volume: 26
Issue: 5-7
Start Page: 776
End Page: 781
Publisher DOI: 10.1016/j.msec.2005.09.029
Abstract: Conductance measurements of nanostructures with simultaneous transmission electron microscopy (TEM) were performed on thin insulating SrF2 films (3 nm thick) and Fe-SrF2 granular films (10 nm thick) deposited on tip-shaped An electrodes. By using a movable counter electrode, nanoscale regions were selected for investigation. Systematic measurements taken during the deformation of the SrF2, film by the counter-electrode provided a tunnelling barrier height of about 2.5 eV The conductance of Fe-SrF2 in nanoscale (similar to 500 nm(2)) showed the Coulomb staircase like characteristics at room temperature. The staircase period approximately corresponded to the value estimated from the geometry observed by TEM. The feasibility of this method is briefly described.
Rights: Copyright © 2005 Elsevier B.V. All rights reserved.
Relation: http://www.sciencedirect.com/science/journal/09284931
Type: article (author version)
URI: http://hdl.handle.net/2115/14442
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 有田 正志

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