Exciton spin relaxation in GaN observed by spin grating experiment


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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/17233

Title:	Exciton spin relaxation in GaN observed by spin grating experiment
Authors:	Ishiguro, T. Browse this author
	Toda, Y. Browse this author →KAKEN DB
	Adachi, S. Browse this author →KAKEN DB
Issue Date:	1-Jan-2007
Publisher:	American Institute of Physics
Journal Title:	Applied Physics Letters
Volume:	90
Issue:	1
Start Page:	011904
Publisher DOI:	10.1063/1.2430402
Abstract:	The authors studied the exciton spin relaxation of bulk GaN by creating spin polarization gratings using degenerate four-wave mixing spectroscopy. The spectrally resolved analysis achieved with this technique facilitated the direct evaluation of spin polarizations in the individual excitons (A and B excitons). The spin polarizations for each exciton decay very quickly (γs～1 ps) at low temperatures. Moreover the γs is faster than the dephasing time T2 throughout the measured temperature range, suggesting the existence of fast intrinsic spin relaxation processes, which can be attributed to a large exchange constant characterized in GaN. ©2007 American Institute of Physics
Rights:	© 2007 American Institute of Physics
Type:	article
URI:	http://hdl.handle.net/2115/17233
Appears in Collections:	工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 戸田泰則

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