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第33輯 >

走査型電子顕微鏡による氷の表面の観察 Ⅱ : 冷却に伴う試料の汚染

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Title: 走査型電子顕微鏡による氷の表面の観察 Ⅱ : 冷却に伴う試料の汚染
Other Titles: Observation of Ice Surfaces by a Scanning Electron MicroscopeⅡ:Contamination on Ice Crystal Surface
Authors: 鈴木, 重尚1 Browse this author
Authors(alt): SUZUKI, Shigenao1
Issue Date: 30-Mar-1976
Publisher: 北海道大学低温科学研究所
Journal Title: 低温科學. 物理篇
Journal Title(alt): Low temperature science. Series A, Physical sciences
Volume: 33
Start Page: 1
End Page: 9
Type: bulletin (article)
URI: http://hdl.handle.net/2115/18269
Appears in Collections:低温科学 = Low Temperature Science > 第33輯

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