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Fiber optical laser spot microscope: A new concept for photoelectrochemical characterization of semiconductor electrodes

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/20577

Title: Fiber optical laser spot microscope: A new concept for photoelectrochemical characterization of semiconductor electrodes
Authors: Carlsson, Per Browse this author
Holmström, Bertil Browse this author
Uosaki, Kohei Browse this author
Kita, Hideaki Browse this author
Issue Date: 12-Sep-1988
Publisher: American Institute of Physics
Journal Title: Applied Physics Letters
Volume: 53
Issue: 11
Start Page: 965
End Page: 967
Publisher DOI: 10.1063/1.100083
Abstract: A fiber optical laser spot microscope, which allows the simultaneous measurements of photocurrent and reflected light intensity or the measurement of laser spot photocurrent under the illumination of other light sources, has been developed to study semiconductor/electrolyte interfaces. The capability of this microscope was demonstrated on as-cleaved and Pt-treated p-InSe. The Pt treatment increased the photocurrent and improved the lateral resolution due to the increase of surface reaction rate. The higher photocurrent was observed at the spot where the reflectivity was higher. This behavior is considered to be due to an uneven distribution of platinum. The laser spot photocurrent image under the illumination of other light sources provided useful information to clarify whether the rate was controlled by surface or bulk properties of InSe.
Rights: Copyright © 1988 American Institute of Physics
Type: article
URI: http://hdl.handle.net/2115/20577
Appears in Collections:理学院・理学研究院 (Graduate School of Science / Faculty of Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 魚崎 浩平

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