Nanoscale thermoelastic probing of megahertz thermal diffusion


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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/28028

Title:	Nanoscale thermoelastic probing of megahertz thermal diffusion
Authors:	Tomoda, Motonobu Browse this author →KAKEN DB
	Wright, Oliver B. Browse this author
	Li Voti, Roberto Browse this author
Issue Date:	13-Aug-2007
Publisher:	American Institute of Physics
Journal Title:	Applied Physics Letters
Volume:	91
Issue:	7
Start Page:	071911
Publisher DOI:	10.1063/1.2770769
Abstract:	The authors demonstrate a method to probe thermal diffusion at megahertz frequencies with nanometer lateral resolution in a thin opaque film on a transparent substrate. They map photothermally induced megahertz surface vibrations in an atomic force microscope using tightly focused optical illumination from the substrate side. By comparison with a theoretical model of the surface displacement field, the authors derive the thermal diffusivity of a thin chromium film on a silica substrate.
Rights:	Copyright © 2007 American Institute of Physics
Relation:	http://apl.aip.org/apl/
Type:	article
URI:	http://hdl.handle.net/2115/28028
Appears in Collections:	工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 友田基信

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