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Nanoscale thermoelastic probing of megahertz thermal diffusion

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Title: Nanoscale thermoelastic probing of megahertz thermal diffusion
Authors: Tomoda, Motonobu Browse this author →KAKEN DB
Wright, Oliver B. Browse this author
Li Voti, Roberto Browse this author
Issue Date: 13-Aug-2007
Publisher: American Institute of Physics
Journal Title: Applied Physics Letters
Volume: 91
Issue: 7
Start Page: 071911
Publisher DOI: 10.1063/1.2770769
Abstract: The authors demonstrate a method to probe thermal diffusion at megahertz frequencies with nanometer lateral resolution in a thin opaque film on a transparent substrate. They map photothermally induced megahertz surface vibrations in an atomic force microscope using tightly focused optical illumination from the substrate side. By comparison with a theoretical model of the surface displacement field, the authors derive the thermal diffusivity of a thin chromium film on a silica substrate.
Rights: Copyright © 2007 American Institute of Physics
Type: article
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 友田 基信

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