同位体顕微鏡 : 高感度二次元イオン検出による結像型SIMS


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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/28040

Title:	同位体顕微鏡 : 高感度二次元イオン検出による結像型SIMS
Other Titles:	Isotope Microscope : Imaging SIMS with High sensitive 2D-ion-detection
Authors:	圦本, 尚義¹ Browse this author →KAKEN DB
Authors(alt):	Yurimoto, Hisayoshi¹
Keywords:	イメージング
	同位体
	二次イオン質量分析法
	荷電粒子
	固体撮像素子
Issue Date:	2006
Publisher:	社団法人　日本顕微鏡学会
Journal Title:	顕微鏡
Volume:	41
Issue:	2
Start Page:	134
End Page:	137
Type:	article (author version)
URI:	http://hdl.handle.net/2115/28040
Appears in Collections:	理学院・理学研究院 (Graduate School of Science / Faculty of Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 圦本尚義

OAI-PMH ( junii2 , jpcoar_1.0 )

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