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Electric-field-induced charge injection or exhaustion in organic thin film transistor

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Title: Electric-field-induced charge injection or exhaustion in organic thin film transistor
Authors: Kiguchi, Manabu Browse this author
Nakayama, Manabu Browse this author
Shimada, Toshihiro Browse this author →KAKEN DB
Saiki, Koichiro Browse this author
Issue Date: 21-Jan-2005
Publisher: American Physical Society
Journal Title: Physical Review B
Volume: 71
Issue: 3
Start Page: 035332
Publisher DOI: 10.1103/PhysRevB.71.035332
Abstract: The conductivity of organic semiconductors is measured in situ and continuously with a bottom contact configuration, as a function of film thickness at various gate voltages. The depletion layer thickness can be directly determined as a shift of the threshold thickness at which electric current began to flow. The in situ and continuous measurement can also determine qualitatively the accumulation layer thickness together with the distribution function of injected carriers. The accumulation layer thickness is a few monolayers and it does not depend on gate voltages. Rather it depends on the chemical species.
Rights: Copyright © 2005 American Physical Society
Type: article
Appears in Collections:理学院・理学研究院 (Graduate School of Science / Faculty of Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 木口 学

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