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Estimating Nanoscale Deformation in Bone by X-ray Diffraction Imaging Method
Title: | Estimating Nanoscale Deformation in Bone by X-ray Diffraction Imaging Method |
Authors: | Tadano, Shigeru Browse this author | Giri, Bijay Browse this author | Sato, Takuya Browse this author | Fujisaki, Kazuhiro Browse this author →KAKEN DB | Todoh, Masahiro Browse this author →KAKEN DB |
Keywords: | Lattice strain | Cortical bone | X-ray diffraction | Imaging plate | Segmentalshift |
Issue Date: | 2008 |
Publisher: | Elsevier |
Journal Title: | Journal of Biomechanics |
Volume: | 41 |
Issue: | 5 |
Start Page: | 945 |
End Page: | 952 |
Publisher DOI: | 10.1016/j.jbiomech.2008.01.005 |
PMID: | 18291405 |
Abstract: | Knowledge of internal stress-strain in bone tissue is important for clinical diagnosis and remedies. The inorganic mineral phase of apatite crystals in bone composite, because of its crystalline nature, provides a reliable way of measurement through X-ray diffraction system. Use of a two-dimensional detector, imaging plate, is considered to expedite the process with much more information, hence, is widely applied in the study of organization, stress, strain, etc for crystalline substance. The distortion of Debye rings in the image obtained by imaging plate can be directly related to the deformation in lattice plane of the crystals. Since X-ray diffraction method involves measurement at nano-level, proper focus on the extraction of data and corresponding analysis is needed. In the current work, we considered weighted average value of intensity to locate radius vectors along azimuthal direction in the diffracted rings from the primary array of digital data in steps of pixels. The widely applied approaches for profile shift measurement - peak-shift and full width at half maximum (FWHM) of a peak, and shift of centre of gravity of profile – were compared with a new concept of segmental-shift (SS) proposed previously by the authors. We observed reliable and effective outcomes with higher precision in the consideration of SS while using imaging plate as a detector. Our approach in this work for intensity integration and radius vector positioning especially add precision in such applications. |
Relation: | http://www.sciencedirect.com/science/journal/00219290 |
Type: | article (author version) |
URI: | http://hdl.handle.net/2115/33896 |
Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 但野 茂
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