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Estimating Nanoscale Deformation in Bone by X-ray Diffraction Imaging Method

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/33896

Title: Estimating Nanoscale Deformation in Bone by X-ray Diffraction Imaging Method
Authors: Tadano, Shigeru Browse this author
Giri, Bijay Browse this author
Sato, Takuya Browse this author
Fujisaki, Kazuhiro Browse this author →KAKEN DB
Todoh, Masahiro Browse this author →KAKEN DB
Keywords: Lattice strain
Cortical bone
X-ray diffraction
Imaging plate
Segmentalshift
Issue Date: 2008
Publisher: Elsevier
Journal Title: Journal of Biomechanics
Volume: 41
Issue: 5
Start Page: 945
End Page: 952
Publisher DOI: 10.1016/j.jbiomech.2008.01.005
PMID: 18291405
Abstract: Knowledge of internal stress-strain in bone tissue is important for clinical diagnosis and remedies. The inorganic mineral phase of apatite crystals in bone composite, because of its crystalline nature, provides a reliable way of measurement through X-ray diffraction system. Use of a two-dimensional detector, imaging plate, is considered to expedite the process with much more information, hence, is widely applied in the study of organization, stress, strain, etc for crystalline substance. The distortion of Debye rings in the image obtained by imaging plate can be directly related to the deformation in lattice plane of the crystals. Since X-ray diffraction method involves measurement at nano-level, proper focus on the extraction of data and corresponding analysis is needed. In the current work, we considered weighted average value of intensity to locate radius vectors along azimuthal direction in the diffracted rings from the primary array of digital data in steps of pixels. The widely applied approaches for profile shift measurement - peak-shift and full width at half maximum (FWHM) of a peak, and shift of centre of gravity of profile – were compared with a new concept of segmental-shift (SS) proposed previously by the authors. We observed reliable and effective outcomes with higher precision in the consideration of SS while using imaging plate as a detector. Our approach in this work for intensity integration and radius vector positioning especially add precision in such applications.
Relation: http://www.sciencedirect.com/science/journal/00219290
Type: article (author version)
URI: http://hdl.handle.net/2115/33896
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 但野 茂

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