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Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm

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Title: Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm
Authors: Aoki, Yoshitaka Browse this author →KAKEN DB
Habazaki, H. Browse this author →KAKEN DB
Kunitake, Toyoki Browse this author
Issue Date: 2008
Publisher: Electrochemical Society
Journal Title: Electrochemical and Solid-State Letters
Volume: 11
Issue: 11
Start Page: P13
End Page: P16
Publisher DOI: 10.1149/1.2976305
Abstract: AlxSi1-xOn films exhibit a drastic change of proton conductivity across the film by reducing their thickness to less than 100 nm. The temperature and humidity dependence of conductivity of the sub-100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-xOn films increases with decreasing the thickness.
Rights: © The Electrochemical Society, Inc. 2008. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in Electrochem. Solid-State Lett., Volume 11, Issue 11, pp. P13-P16 (2008).
Type: article
URI: http://hdl.handle.net/2115/35000
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 青木 芳尚

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