|
Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
Peer-reviewed Journal Articles, etc >
Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm
| Title: | Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm |
| Authors: | Aoki, Yoshitaka Browse this author →KAKEN DB | | Habazaki, H. Browse this author →KAKEN DB | | Kunitake, Toyoki Browse this author |
| Issue Date: | 2008 |
| Publisher: | Electrochemical Society |
| Journal Title: | Electrochemical and Solid-State Letters |
| Volume: | 11 |
| Issue: | 11 |
| Start Page: | P13 |
| End Page: | P16 |
| Publisher DOI: | 10.1149/1.2976305 |
| Abstract: | AlxSi1-xOn films exhibit a drastic change of proton conductivity across the film by reducing their thickness to less than 100 nm. The temperature and humidity dependence of conductivity of the sub-100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-xOn films increases with decreasing the thickness. |
| Rights: | © The Electrochemical Society, Inc. 2008. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in Electrochem. Solid-State Lett., Volume 11, Issue 11, pp. P13-P16 (2008). |
| Type: | article |
| URI: | http://hdl.handle.net/2115/35000 |
| Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
|
Submitter: 青木 芳尚
|
