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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.132 >

容量過渡解析によるAl2O3/native oxide/InP MIS構造の評価

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/41991

Title: 容量過渡解析によるAl2O3/native oxide/InP MIS構造の評価
Other Titles: Characterization of Interface Properties of Al2O3/native oxide/InP MIS Structure by Capacitance Transient Analysis
Authors: 増田, 宏1 Browse this author
何, 力2 Browse this author
長谷川, 英機3 Browse this author
沢田, 孝幸4 Browse this author
大野, 英男5 Browse this author
Authors(alt): Masuda, Hiroshi1
He, Li2
Hasegawa, Hideki3
Sawada, Takayuki4
Ohno, Hideo5
Issue Date: 31-Jul-1986
Publisher: 北海道大学
Journal Title: 北海道大學工學部研究報告
Journal Title(alt): Bulletin of the Faculty of Engineering, Hokkaido University
Volume: 132
Start Page: 89
End Page: 99
Type: bulletin (article)
URI: http://hdl.handle.net/2115/41991
Appears in Collections:北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.132

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