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Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.132 >
容量過渡解析によるAl2O3/native oxide/InP MIS構造の評価
| Title: | 容量過渡解析によるAl2O3/native oxide/InP MIS構造の評価 |
| Other Titles: | Characterization of Interface Properties of Al2O3/native oxide/InP MIS Structure by Capacitance Transient Analysis |
| Authors: | 増田, 宏1 Browse this author | | 何, 力2 Browse this author | | 長谷川, 英機3 Browse this author | | 沢田, 孝幸4 Browse this author | | 大野, 英男5 Browse this author |
| Authors(alt): | Masuda, Hiroshi1 | | He, Li2 | | Hasegawa, Hideki3 | | Sawada, Takayuki4 | | Ohno, Hideo5 |
| Issue Date: | 31-Jul-1986 |
| Publisher: | 北海道大学 |
| Journal Title: | 北海道大學工學部研究報告 |
| Journal Title(alt): | Bulletin of the Faculty of Engineering, Hokkaido University |
| Volume: | 132 |
| Start Page: | 89 |
| End Page: | 99 |
| Type: | bulletin (article) |
| URI: | http://hdl.handle.net/2115/41991 |
| Appears in Collections: | 北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.132
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