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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.156 >

シリコン超薄膜を用いたInGaAsの表面不活性化とその応用

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/42285

Title: シリコン超薄膜を用いたInGaAsの表面不活性化とその応用
Other Titles: A New Surface Passivation Method of InGaAs Using a Si Ultrathin Layer and Its Application
Authors: 大植, 英司1 Browse this author
赤沢, 正道2 Browse this author
児玉, 聡3 Browse this author
長谷川, 英機4 Browse this author
Authors(alt): Ohue, Eiji1
Akazawa, Masamichi2
Kodama, Satoshi3
Hasegawa, Hideki4
Issue Date: 20-Jul-1991
Publisher: 北海道大学
Journal Title: 北海道大學工學部研究報告
Journal Title(alt): Bulletin of the Faculty of Engineering, Hokkaido University
Volume: 156
Start Page: 51
End Page: 58
Type: bulletin (article)
URI: http://hdl.handle.net/2115/42285
Appears in Collections:北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.156

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