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Characteristic structures of the Si(111)-7×7 surface step studied by scanning tunneling microscopy

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Title: Characteristic structures of the Si(111)-7×7 surface step studied by scanning tunneling microscopy
Authors: Miyake, K. Browse this author
Okawa, S. Browse this author
Takeuchi, O. Browse this author
Futaba, D. N. Browse this author
Hata, K. Browse this author
Morita, R. Browse this author
Yamashita, M. Browse this author
Shigekawa, H. Browse this author
Issue Date: Jul-2001
Publisher: American Vacuum Society
Journal Title: Journal of Vacuum Science & Technology A
Volume: 19
Issue: 4
Start Page: 1549
End Page: 1552
Publisher DOI: 10.1116/1.1359538
Abstract: Contrary to previous results concluding that all 7×7 boundaries in the down step edge were complete, 5×5 faulted half units were found to be introduced in part when the transition region was narrow. In addition, the formation characteristic of the 5×5 faulted half units was strongly influenced by the type of step configuration (nF or nU) and by the structure of the upper step edge (complete or incomplete). Even when the step configuration was the same, the difference in the upper step edge structures strongly affected introduction of 5×5 units.
Rights: Copyright 2001 American Vacuum Society. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Vacuum Society. The following article appeared in J. Vac. Sci. Technol. A 19, 1549 (2001) and may be found at
Type: article
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 山下 幹雄

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