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Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy

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Title: Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy
Authors: Takeuchi, Osamu Browse this author
Aoyama, Masahiro Browse this author
Oshima, Ryuji Browse this author
Okada, Yoshitaka Browse this author
Oigawa, Haruhiro Browse this author
Sano, Nobuyuki Browse this author
Shigekawa, Hidemi Browse this author
Morita, Ryuji Browse this author →KAKEN DB
Yamashita, Mikio Browse this author →KAKEN DB
Issue Date: 11-Oct-2004
Publisher: American Institute of Physics
Journal Title: Applied Physics Letters
Volume: 85
Issue: 15
Start Page: 3268
End Page: 3270
Publisher DOI: 10.1063/1.1804238
Abstract: Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown GaN_[x]As_[1-x] (x=0.36%) sample exhibited two ultrafast transient processes in the time-resolved tunnel current signal, whose lifetimes were determined to be 0.653±0.025 and 55.1±5.0 ps. These values are of the same order of magnitude as those measured in the conventional pump-probe reflectivity measurement.
Rights: Copyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 85, 3268 (2004) and may be found at https://dx.doi.org/10.1063/1.1804238
Type: article
URI: http://hdl.handle.net/2115/45341
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 山下 幹雄

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