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Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy
Title: | Probing subpicosecond dynamics using pulsed laser combined scanning tunneling microscopy |
Authors: | Takeuchi, Osamu Browse this author | Aoyama, Masahiro Browse this author | Oshima, Ryuji Browse this author | Okada, Yoshitaka Browse this author | Oigawa, Haruhiro Browse this author | Sano, Nobuyuki Browse this author | Shigekawa, Hidemi Browse this author | Morita, Ryuji Browse this author →KAKEN DB | Yamashita, Mikio Browse this author →KAKEN DB |
Issue Date: | 11-Oct-2004 |
Publisher: | American Institute of Physics |
Journal Title: | Applied Physics Letters |
Volume: | 85 |
Issue: | 15 |
Start Page: | 3268 |
End Page: | 3270 |
Publisher DOI: | 10.1063/1.1804238 |
Abstract: | Time-resolved tunneling current measurement in the subpicosecond range was realized by ultrashort-pulse laser combined scanning tunneling microscopy, using the shaken-pulse-pair method. A low-temperature-grown GaN_[x]As_[1-x] (x=0.36%) sample exhibited two ultrafast transient processes in the time-resolved tunnel current signal, whose lifetimes were determined to be 0.653±0.025 and 55.1±5.0 ps. These values are of the same order of magnitude as those measured in the conventional pump-probe reflectivity measurement. |
Rights: | Copyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 85, 3268 (2004) and may be found at https://dx.doi.org/10.1063/1.1804238 |
Type: | article |
URI: | http://hdl.handle.net/2115/45341 |
Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 山下 幹雄
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