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Low voltage electron diffractive imaging of atomic structure in single-wall carbon nanotubes

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Title: Low voltage electron diffractive imaging of atomic structure in single-wall carbon nanotubes
Authors: Kamimura, Osamu Browse this author
Maehara, Yosuke Browse this author
Dobashi, Takashi Browse this author
Kobayashi, Keita Browse this author
Kitaura, Ryo Browse this author
Shinohara, Hisanori Browse this author
Shioya, Hiroyuki Browse this author
Gohara, Kazutoshi Browse this author
Keywords: atomic structure
carbon nanotubes
electron diffraction
scanning electron microscopy
Issue Date: Apr-2011
Publisher: American Institute of Physics (AIP)
Journal Title: Applied Physics Letters
Volume: 98
Issue: 17
Start Page: 174103-1
End Page: 174103-3
Publisher DOI: 10.1063/1.3582240
Abstract: The demand for atomic-scale analysis without serious damage to the specimen has been increasing due to the spread of applications with light-element three-dimensional (3D) materials. Low voltage electron diffractive imaging has the potential possibility to clarify the atomic-scale structure of 3D materials without causing serious damage to specimens. We demonstrate low-voltage (30 kV) electron diffractive imaging of single-wall carbon nanotube at a resolution of 0.12 nm. In the reconstructed pattern, the intensity difference between single carbon atom and two overlapping atoms can be clearly distinguished. The present method can generally be applied to other materials including biologically important ones.
Rights: Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Type: article
URI: http://hdl.handle.net/2115/45434
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 郷原 一寿

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