Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
Peer-reviewed Journal Articles, etc >
Pulsed neutron spectroscopic imaging for crystallographic texture and microstructure
Title: | Pulsed neutron spectroscopic imaging for crystallographic texture and microstructure |
Authors: | Sato, Hirotaka Browse this author | Kamiyama, Takashi Browse this author | Iwase, Kenji Browse this author | Ishigaki, Toru Browse this author | Kiyanagi, Yoshiaki Browse this author →KAKEN DB |
Keywords: | Bragg-edge transmission imaging | Rietveld analysis | Texture | Crystallite size | Neutron diffraction |
Issue Date: | 21-Sep-2011 |
Publisher: | Elsevier B.V. |
Journal Title: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume: | 651 |
Issue: | 1 |
Start Page: | 216 |
End Page: | 220 |
Publisher DOI: | 10.1016/j.nima.2011.01.063 |
Abstract: | A time-of-flight (TOF) spectroscopic neutron imaging at a pulsed neutron source is expected to be a new material analysis tool because this method can non-destructively investigate the spatial dependence of the crystallographic and metallographic information in a bulk material. For quantitative evaluation of such information, a spectral analysis code for the transmission data is necessary. Therefore, we have developed a Rietveld-like analysis code, RITS. Furthermore, we have applied the RITS code to evaluation of the position dependence of the crystal orientation anisotropy, the preferred orientation and the crystallite size of a welded α-iron plate, and we have successfully obtained the information on the texture and the microstructure. However, the reliability of the values given by the RITS code has not been evaluated yet in detail. For this reason, we compared the parameters provided by the RITS code with the parameters obtained by the neutron TOF powder diffractometry and its Rietveld analysis. Both the RITS code and the Rietveld analysis software indicated values close to each other, but there were systematic differences on the preferred orientation and the crystallite size. |
Type: | article (author version) |
URI: | http://hdl.handle.net/2115/47382 |
Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
|
Submitter: 鬼柳 善明
|