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Potential modulation reflectance of passivated type 304 stainless steel in sulfuric acid solution
| Title: | Potential modulation reflectance of passivated type 304 stainless steel in sulfuric acid solution |
| Authors: | Ohtsuka, Toshiaki Browse this author →KAKEN DB | | Hyono, Atsushi Browse this author | | Sasaki, Yuki Browse this author |
| Keywords: | Potential modulation reflectance | | Stainless steel | | Passive film | | Ellipsometry | | Semiconducting oxide |
| Issue Date: | 15-Jan-2012 |
| Publisher: | Elsevier |
| Journal Title: | Electrochimica Acta |
| Volume: | 60 |
| Start Page: | 384 |
| End Page: | 391 |
| Publisher DOI: | 10.1016/j.electacta.2011.11.064 |
| Abstract: | Potential modulation reflectance (PMR) was applied to passivated type 304 stainless steel covered by a passive oxide film in 0.1 mol dm^[-3] sulfuric acid solution. The ellipsometry measurements showed that the passive oxide film was 1.0 nm thick at the beginning of passivation at 0.1 V vs. Ag/AgCl and increased to 1.8 nm with potential at 0.9 V in the transpassive region. Under positive bias, the signal intensity of PMR was proportional to the capacitance of the space charge formed in the n-type semiconducting passive oxide. The Mott-Schottky type plot was applicable to PMR as well as capacitance. From the plots the oxide film was found to behave as an n-type semiconducting layer. A threshold photon energy of 2.4 eV in the PMR-wavelength relation may correspond to the optical absorption edge of the passive oxide. |
| Type: | article (author version) |
| URI: | http://hdl.handle.net/2115/48546 |
| Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 大塚 俊明
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