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Potential modulation reflectance of passivated type 304 stainless steel in sulfuric acid solution

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Title: Potential modulation reflectance of passivated type 304 stainless steel in sulfuric acid solution
Authors: Ohtsuka, Toshiaki Browse this author →KAKEN DB
Hyono, Atsushi Browse this author
Sasaki, Yuki Browse this author
Keywords: Potential modulation reflectance
Stainless steel
Passive film
Ellipsometry
Semiconducting oxide
Issue Date: 15-Jan-2012
Publisher: Elsevier
Journal Title: Electrochimica Acta
Volume: 60
Start Page: 384
End Page: 391
Publisher DOI: 10.1016/j.electacta.2011.11.064
Abstract: Potential modulation reflectance (PMR) was applied to passivated type 304 stainless steel covered by a passive oxide film in 0.1 mol dm^[-3] sulfuric acid solution. The ellipsometry measurements showed that the passive oxide film was 1.0 nm thick at the beginning of passivation at 0.1 V vs. Ag/AgCl and increased to 1.8 nm with potential at 0.9 V in the transpassive region. Under positive bias, the signal intensity of PMR was proportional to the capacitance of the space charge formed in the n-type semiconducting passive oxide. The Mott-Schottky type plot was applicable to PMR as well as capacitance. From the plots the oxide film was found to behave as an n-type semiconducting layer. A threshold photon energy of 2.4 eV in the PMR-wavelength relation may correspond to the optical absorption edge of the passive oxide.
Type: article (author version)
URI: http://hdl.handle.net/2115/48546
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 大塚 俊明

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