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Humidity-Dependent Structure of Surface Water on Perfluorosulfonated Ionomer Thin Film Studied by Sum Frequency Generation Spectroscopy

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Title: Humidity-Dependent Structure of Surface Water on Perfluorosulfonated Ionomer Thin Film Studied by Sum Frequency Generation Spectroscopy
Authors: Noguchi, Hidenori Browse this author →KAKEN DB
Taneda, Kento Browse this author
Minowa, Hiroshi Browse this author
Naohara, Hideo Browse this author
Uosaki, Kohei Browse this author →KAKEN DB
Issue Date: 11-Mar-2010
Publisher: American Chemical Society
Journal Title: Journal of Physical Chemistry C
Volume: 114
Issue: 9
Start Page: 3958
End Page: 3961
Publisher DOI: 10.1021/jp907194k
Abstract: Humidity-dependent water structure on the Nafion thin film surface was determined at room temperature by using sum frequency generation spectroscopy (SFG). When the Nafion thin film was exposed to a low relative humidity (RH) environment, a peak at 3720 cm^[-1] due to the "dangling OH" or "free OH" of water molecules and a peak centered around 3600 cm^[-1], which was assigned to be due to water molecules interacting with sulfonate groups of the Nafion surface, were observed. The intensities of these peaks increased as RH was increased. A broad peak centered around 3200-3300 cm^[-1] due to water adsorbed on hydrophobic, i.e., fluorocarbon, sites of Nafion was observed when the Nafion thin film was exposed to a high RH environment (RH > 60%). The behavior of surface water is compared with that of water in bulk Nafion.
Type: article
URI: http://hdl.handle.net/2115/50206
Appears in Collections:理学院・理学研究院 (Graduate School of Science / Faculty of Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 魚崎 浩平

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