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Probing the Molecular Conformation of Self-Assembled Monolayers at Metal/Semiconductor Interfaces by Vibrational Sum Frequency Generation Spectroscopy

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Title: Probing the Molecular Conformation of Self-Assembled Monolayers at Metal/Semiconductor Interfaces by Vibrational Sum Frequency Generation Spectroscopy
Authors: Asanuma, Hidehiko Browse this author
Noguchi, Hidenori Browse this author →KAKEN DB
Huang, Yifan Browse this author
Uosaki, Kohei Browse this author →KAKEN DB
Yu, Hua-Zhong Browse this author
Issue Date: 17-Dec-2009
Publisher: American Chemical Society
Journal Title: Journal of Physical Chemistry C
Volume: 113
Issue: 50
Start Page: 21139
End Page: 21146
Publisher DOI: 10.1021/jp9062675
Abstract: The conformation of self-assembled monolayers (SAMs) buried at metal-semiconductor interfaces plays a crucial role in the functioning of the molecular junctions thus formed. We have studied by vibrational sum frequency generation (SFG) spectroscopy the influence of deposited gold films on the molecular orientation of a series of n-alkyl monolayers that are covalently bonded to silicon(111) via Si-C linkages (≡Si-CnH_[2n+1],n = 10, 12, 14, and 18). The SFG spectra indicate that the gold contacts (overlayers) introduce significant gauche defects within the initially highly oriented alkyl chains. The methyl tilt angles of the buried n-alkyl monolayers depend on the gold deposition method (vacuum evaporation vs sputtering) and the alkyl chain length. These observations are supported by solid-state electrical measurements.
Type: article
URI: http://hdl.handle.net/2115/50209
Appears in Collections:理学院・理学研究院 (Graduate School of Science / Faculty of Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 魚崎 浩平

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