|
Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Science / Faculty of Science >
Peer-reviewed Journal Articles, etc >
Electron Transfer through Organic Monolayers Directly Bonded to Silicon Probed by Current Sensing Atomic Force Microscopy : Effect of Chain Length and Applied Force
| Title: | Electron Transfer through Organic Monolayers Directly Bonded to Silicon Probed by Current Sensing Atomic Force Microscopy : Effect of Chain Length and Applied Force |
| Authors: | Zhao, Jianwei Browse this author | | Uosaki, Kohei Browse this author →KAKEN DB |
| Issue Date: | 4-Nov-2004 |
| Publisher: | American Chemical Society |
| Journal Title: | Journal of Physical Chemistry B |
| Volume: | 108 |
| Issue: | 44 |
| Start Page: | 17129 |
| End Page: | 17135 |
| Publisher DOI: | 10.1021/jp049719+ |
| Abstract: | Electron transfer through organic monolayers directly bonded to a silicon surface has been investigated by using a current sensing atomic force microscope (CSAFM). The research system employs a platinum-coated CSAFM tip in point contact at a confined nanometer size with a set of alkyl monolayers of various chain lengths, which are covalently bonded directly to an n-type Si(111) by immersing a H-terminated silicon substrate in neat CH2=CH-(CH2)_[n-3]CH3 (n = 12, 14, 16, and 18) under heating. The current flows were analyzed with a modified electron-tunneling model and showed strong force and chain length dependences. Increasing the applied force resulted in a negative shift of the current-voltage (I-V) curves. This observation was mainly explained by the amplified contact area and shortened tunneling distance. In addition, the I-V curves showed chain length dependence, from which the bias-dependent electron tunneling coefficient, β, was analyzed. |
| Type: | article |
| URI: | http://hdl.handle.net/2115/50226 |
| Appears in Collections: | 理学院・理学研究院 (Graduate School of Science / Faculty of Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
|
Submitter: 魚崎 浩平
|
