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Detection of the valence band in buried Co2MnSi–MgO tunnel junctions by means of photoemission spectroscopy

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Title: Detection of the valence band in buried Co2MnSi–MgO tunnel junctions by means of photoemission spectroscopy
Authors: Fecher, Gerhard H. Browse this author
Balke, Benjamin Browse this author
Gloskowskii, Andrei Browse this author
Ouardi, Siham Browse this author
Felser, Claudia Browse this author
Ishikawa, Takayuki Browse this author
Yamamoto, Masafumi Browse this author →KAKEN DB
Yamashita, Yoshiyuki Browse this author
Yoshikawa, Hideki Browse this author
Ueda, Shigenori Browse this author
Kobayashi, Keisuke Browse this author
Issue Date: 16-May-2008
Publisher: American Institute of Physics
Journal Title: Applied Physics Letters
Volume: 92
Issue: 19
Start Page: 193513
Publisher DOI: 10.1063/1.2931089
Abstract: This work reports on the detection of the valence band of buried Heusler compounds by means of hard x-ray photoemission spectroscopy. The measurements have been performed on the so-called “half” tunnel junctions that are thin films of Co2MnSi underneath MgO. Starting from the substrate, the structure of the samples is MgO(buffer)–Co2MnSi–MgO(tMgO)–AlOx with a thickness tMgO of the upper MgO layer of 2 and 20 nm. The valence band x-ray photoemission spectra have been excited by hard x rays of about 6 keV energy. The valence band spectra have been used to estimate the mean free path of the electrons through the MgO layer to be 17 nm at kinetic energies of about 6 keV. In particular, it is shown that the buried Co2MnSi films exhibit the same valence density of states as in bulk samples.
Rights: Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 92, 193513 and may be found at https://dx.doi.org/10.1063/1.2931089
Type: article
URI: http://hdl.handle.net/2115/50605
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 山本 眞史

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