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Detection of the valence band in buried Co2MnSi–MgO tunnel junctions by means of photoemission spectroscopy
Title: | Detection of the valence band in buried Co2MnSi–MgO tunnel junctions by means of photoemission spectroscopy |
Authors: | Fecher, Gerhard H. Browse this author | Balke, Benjamin Browse this author | Gloskowskii, Andrei Browse this author | Ouardi, Siham Browse this author | Felser, Claudia Browse this author | Ishikawa, Takayuki Browse this author | Yamamoto, Masafumi Browse this author →KAKEN DB | Yamashita, Yoshiyuki Browse this author | Yoshikawa, Hideki Browse this author | Ueda, Shigenori Browse this author | Kobayashi, Keisuke Browse this author |
Issue Date: | 16-May-2008 |
Publisher: | American Institute of Physics |
Journal Title: | Applied Physics Letters |
Volume: | 92 |
Issue: | 19 |
Start Page: | 193513 |
Publisher DOI: | 10.1063/1.2931089 |
Abstract: | This work reports on the detection of the valence band of buried Heusler compounds by means of hard x-ray photoemission spectroscopy. The measurements have been performed on the so-called “half” tunnel junctions that are thin films of Co2MnSi underneath MgO. Starting from the substrate, the structure of the samples is MgO(buffer)–Co2MnSi–MgO(tMgO)–AlOx with a thickness tMgO of the upper MgO layer of 2 and 20 nm. The valence band x-ray photoemission spectra have been excited by hard x rays of about 6 keV energy. The valence band spectra have been used to estimate the mean free path of the electrons through the MgO layer to be 17 nm at kinetic energies of about 6 keV. In particular, it is shown that the buried Co2MnSi films exhibit the same valence density of states as in bulk samples. |
Rights: | Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 92, 193513 and may be found at https://dx.doi.org/10.1063/1.2931089 |
Type: | article |
URI: | http://hdl.handle.net/2115/50605 |
Appears in Collections: | 情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 山本 眞史
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