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Ultrafast ellipsometric interferometry for direct detection of coherent phonon strain pulse profiles
| Title: | Ultrafast ellipsometric interferometry for direct detection of coherent phonon strain pulse profiles |
| Authors: | Matsuda, Osamu Browse this author →KAKEN DB | | Tomoda, Motonobu Browse this author | | Tachizaki, Takehiro Browse this author | | Koiwa, Shun Browse this author | | Ono, Atsushi Browse this author | | Aoki, Kae Browse this author | | Beardsley, Ryan P. Browse this author | | Wright, Oliver B. Browse this author |
| Issue Date: | Jul-2013 |
| Publisher: | Optical Society of America |
| Journal Title: | Journal of the Optical Society of America B - Optical Physics |
| Volume: | 30 |
| Issue: | 7 |
| Start Page: | 1911 |
| End Page: | 1921 |
| Publisher DOI: | 10.1364/JOSAB.30.001911 |
| Abstract: | We describe an ultrafast optical technique to quantitatively detect picosecond ultrasonic displacements of solid surfaces, thus giving access to the longitudinal strain pulse shape. Transient optical reflectance changes recorded at oblique optical incidence with a common-path interferometric configuration based on ultrafast ellipsometry monitor gigahertz coherent phonon pulses. We demonstrate for a tungsten film the quantitative extraction of the strain pulse shape free of distortions arising from the photoelastic effect, and analyze the results with the two-temperature model to obtain the value g approximate to 3 x 10(17) Wm(-3) K-1 for the electron-phonon coupling constant. Analysis of the data also reveals a thermo-optic contribution. (C) 2013 Optical Society of America |
| Rights: | © 2013 Optical Society of America, Inc. |
| Type: | article |
| URI: | http://hdl.handle.net/2115/53078 |
| Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 松田 理
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