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Ultrafast ellipsometric interferometry for direct detection of coherent phonon strain pulse profiles

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Title: Ultrafast ellipsometric interferometry for direct detection of coherent phonon strain pulse profiles
Authors: Matsuda, Osamu Browse this author →KAKEN DB
Tomoda, Motonobu Browse this author
Tachizaki, Takehiro Browse this author
Koiwa, Shun Browse this author
Ono, Atsushi Browse this author
Aoki, Kae Browse this author
Beardsley, Ryan P. Browse this author
Wright, Oliver B. Browse this author
Issue Date: Jul-2013
Publisher: Optical Society of America
Journal Title: Journal of the Optical Society of America B - Optical Physics
Volume: 30
Issue: 7
Start Page: 1911
End Page: 1921
Publisher DOI: 10.1364/JOSAB.30.001911
Abstract: We describe an ultrafast optical technique to quantitatively detect picosecond ultrasonic displacements of solid surfaces, thus giving access to the longitudinal strain pulse shape. Transient optical reflectance changes recorded at oblique optical incidence with a common-path interferometric configuration based on ultrafast ellipsometry monitor gigahertz coherent phonon pulses. We demonstrate for a tungsten film the quantitative extraction of the strain pulse shape free of distortions arising from the photoelastic effect, and analyze the results with the two-temperature model to obtain the value g approximate to 3 x 10(17) Wm(-3) K-1 for the electron-phonon coupling constant. Analysis of the data also reveals a thermo-optic contribution. (C) 2013 Optical Society of America
Rights: © 2013 Optical Society of America, Inc.
Type: article
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 松田 理

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