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Title: 低エネルギー電子回折イメージング
Authors: KAMIMURA, Osamu Browse this author
Gohara, Kazutoshi Browse this author →KAKEN DB
Issue Date: 2013
Journal Title: Nihon Kessho Gakkaishi
Volume: 55
Issue: 6
Start Page: 350
End Page: 355
Publisher DOI: 10.5940/jcrsj.55.350
Abstract: Unlike conventional crystallography techniques, diffractive imaging becomes possible to analyze the specimen structure of non-crystalline materials. Combined low-energy electron beam with diffractive imaging, low-damage imaging technique has been developed for the analysis of light element material that is susceptible to damage due to beam. Here, it is described with respect to results of verification of low-energy electron diffractive imaging and atomic resolution imaging with carbon nanotubes as specimens. Furthermore, features of electron diffractive imaging in comparison with X-ray and our approach and efforts to date are described in this article.
Type: article
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 郷原 一寿

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