Interface structure of half-metallic Heusler alloy Co2MnSi thin films facing an MgO tunnel barrier determined by x-ray magnetic circular dichroism


Hokkaido University \| Library \| HUSCAP	Advanced Search		言語

	Home
	About HUSCAP
	Open Access Policy

	Browse by Author

Browse
	Communities & Collections

	Scholarly Journals
	Theses
	Doctoral Dissertations Listed by Graduate Schools
	Conference Procs.
	Events

	HUSCAP Senior (in Japanese)

	Societies

	Downloads (country)

For university staff
	How to post your papers to HUSCAP
	Publication of theses
	Helpline about theses publication

Open Archives Compliant

You can search our collection also at:
	Google
	Google Scholar
	CiNii
	IRDB
	OAIster
	NDLTD

Files in This Item:

PRB_81_144417.pdf

472.97 kB

PDF

Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/54791

Title:	Interface structure of half-metallic Heusler alloy Co2MnSi thin films facing an MgO tunnel barrier determined by x-ray magnetic circular dichroism
Authors:	Saito, Toshiaki Browse this author
	Katayama, Toshikazu Browse this author
	Ishikawa, Takayuki Browse this author
	Yamamoto, Masafumi Browse this author →KAKEN DB
	Asakura, Daisuke Browse this author
	Koide, Tsuneharu Browse this author
	Miura, Yoshio Browse this author
	Shirai, Masafumi Browse this author
Issue Date:	15-Apr-2010
Publisher:	American Physical Society
Journal Title:	Physical Review B
Volume:	81
Issue:	14
Start Page:	144417
Publisher DOI:	10.1103/PhysRevB.81.144417
Rights:	© 2010 American Physical Society
Type:	article
URI:	http://hdl.handle.net/2115/54791
Appears in Collections:	情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 山本眞史

OAI-PMH ( junii2 , jpcoar_1.0 )

- Hokkaido University