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Interface structure of half-metallic Heusler alloy Co2MnSi thin films facing an MgO tunnel barrier determined by x-ray magnetic circular dichroism

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Title: Interface structure of half-metallic Heusler alloy Co2MnSi thin films facing an MgO tunnel barrier determined by x-ray magnetic circular dichroism
Authors: Saito, Toshiaki Browse this author
Katayama, Toshikazu Browse this author
Ishikawa, Takayuki Browse this author
Yamamoto, Masafumi Browse this author →KAKEN DB
Asakura, Daisuke Browse this author
Koide, Tsuneharu Browse this author
Miura, Yoshio Browse this author
Shirai, Masafumi Browse this author
Issue Date: 15-Apr-2010
Publisher: American Physical Society
Journal Title: Physical Review B
Volume: 81
Issue: 14
Publisher DOI: 10.1103/PhysRevB.81.144417
Rights: © 2010 American Physical Society
Type: article
URI: http://hdl.handle.net/2115/54791
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 山本 眞史

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