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Dielectric properties of organic monolayers directly bonded on silicon probed by current sensing atomic force microscope
| Title: | Dielectric properties of organic monolayers directly bonded on silicon probed by current sensing atomic force microscope |
| Authors: | Zhao, Jianwei Browse this author | | Uosaki, Kohei2 Browse this author →KAKEN DB |
| Authors(alt): | 魚崎, 浩平2 |
| Issue Date: | 8-Sep-2003 |
| Publisher: | American Institute of Physics |
| Journal Title: | Applied Physics Letters |
| Volume: | 83 |
| Issue: | 10 |
| Start Page: | 2034 |
| End Page: | 2036 |
| Publisher DOI: | 10.1063/1.1609237 |
| Abstract: | The dielectric properties of alkyl monolayers with various chain lengths [CH3(CH2)n–1- (n = 12, 14, 16, and 18)] covalently bonded to a hydrogen terminated n-type silicon (111) surface in a nanoscale region were evaluated using current sensing atomic force microscopy (AFM). A reliable electrical contact between the alkyl monolayers and the metal-coated AFM tip was achieved under slight stress. At a force less than 2 nN, current sharply increased as the bias was scanned over a critical value, showing that breakdown took place. The breakdown voltage linearly depended on the chain length of the alkyl monolayers and the dielectric strength of 2.0 GV/m was derived from the slope of this relation. |
| Rights: | Copyright © 2003 American Institute of Physics |
| Relation: | http://www.aip.org/ |
| Type: | article |
| URI: | http://hdl.handle.net/2115/5701 |
| Appears in Collections: | 理学院・理学研究院 (Graduate School of Science / Faculty of Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 魚崎 浩平
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