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In situ x-ray photoelectron spectroscopy for electrochemical reactions in ordinary solvents

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Title: In situ x-ray photoelectron spectroscopy for electrochemical reactions in ordinary solvents
Authors: Masuda, Takuya Browse this author
Yoshikawa, Hideki Browse this author
Noguchi, Hidenori Browse this author
Kawasaki, Tadahiro Browse this author
Kobata, Masaaki Browse this author
Kobayashi, Keisuke Browse this author
Uosaki, Kohei Browse this author →KAKEN DB
Issue Date: 9-Sep-2013
Publisher: American Institute of Physics
Journal Title: Applied Physics Letters
Volume: 103
Issue: 11
Start Page: 111605
Publisher DOI: 10.1063/1.4821180
Abstract: In situ electrochemical X-ray photoelectron spectroscopy (XPS) apparatus, which allows XPS at solid/liquid interfaces under potential control, was constructed utilizing a microcell with an ultra-thin Si membrane, which separates vacuum and a solution. Hard X-rays from a synchrotron source penetrate into the Si membrane surface exposed to the solution. Electrons emitted at the Si/solution interface can pass through the membrane and be analyzed by an analyzer placed in vacuum. Its operation was demonstrated for potential-induced Si oxide growth in water. Effect of potential and time on the thickness of Si and Si oxide layers was quantitatively determined at sub-nanometer resolution.
Rights: Copyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 103, 111605, 2013, and may be found at
Type: article
Appears in Collections:理学院・理学研究院 (Graduate School of Science / Faculty of Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 魚崎 浩平

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