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Ellipsometric Study of Anodic Oxide Films on Titanium in Hydrochloric Acid, Sulfuric Acid, and Phosphate Solution

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J.Electrochem.Soc.132,787-792(1985),Ellipsometric ---titanium hydrochloric--sulfuruc--phosphate.pdf688.86 kBPDFView/Open
Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/62206

Title: Ellipsometric Study of Anodic Oxide Films on Titanium in Hydrochloric Acid, Sulfuric Acid, and Phosphate Solution
Authors: Ohtsuka, Toshiaki Browse this author →KAKEN DB
Masuda, Minoru Browse this author
Sato, Norio Browse this author
Keywords: nodisation
films
titanium
inorganic acids
chlorine compounds
sulphur compounds
phosphorus compounds
refractive index
ellipsometry
scanning electron microscopy
Issue Date: Apr-1985
Publisher: The Electrochemical Society
Journal Title: J. Electrochemical Society
Volume: 132
Issue: 4
Start Page: 787
End Page: 792
Publisher DOI: 10.1149/1.2113958
Abstract: The anodic oxide film on titanium has been studied by ellipsometry and SEM observation. Ex situ multiple‐angle‐of‐incidence and in situ ellipsometric measurements allow the complex refractive index to be estimated at n = 2.3- 2.9i for the titanium substrate and at n = 2.1-0.03i for the anodic oxide film at wavelength 546.1 nm. The anodic oxide film thickness increases linearly with potential in a range from −0.55 to 7.5V (RHE) at the rate of 2.8 nm V^−1 in phosphate solutions of pH 1.6–12.1, 2.5 nm V^−1 in 0.1M HCl solution, and 2.4 nm V^−1 in 0.1M H2SO4 solution. At potentials more positive than 7.5V, the film breaks down, leading to the formation of a thick oxide film probably due to an increased ionic current through the breakdown sites. The film composition is estimated to be TiO2(H20)l.4 or TiO0.6(OH)2.8 , which suggests the presence of hydroxyl bridge in its bonding structure.
Rights: © The Electrochemical Society, Inc. 1985. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in J. Electrochem. Soc. 1985 volume 132, issue 4, 787-792.
Type: article
URI: http://hdl.handle.net/2115/62206
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 大塚 俊明

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