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Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
Peer-reviewed Journal Articles, etc >
Thermal deformation analysis of tabbed solar cells using solder alloy and conductive film
| Title: | Thermal deformation analysis of tabbed solar cells using solder alloy and conductive film |
| Authors: | Hasan, Md Kamrul Browse this author | | Sasaki, Katsuhiko Browse this author →KAKEN DB |
| Keywords: | Conductive film | | Cyclic thermal stress | | FEA | | Silicon wafer | | Solar cell | | Solder alloy |
| Issue Date: | Jul-2016 |
| Publisher: | Korean Society of Mechnical Engineers |
| Journal Title: | Journal of mechanical science and technology |
| Volume: | 30 |
| Issue: | 7 |
| Start Page: | 3085 |
| End Page: | 3095 |
| Publisher DOI: | 10.1007/s12206-016-0617-4 |
| Abstract: | Finite element analysis (FEA) has been carried out with the aim of understanding the thermal deformation characteristics of two solar cell configurations. One of the solar cell models is tabbed by lead-free solder, the other model by Conductive film (CF). A high temperature soldering process could weaken the bond and reduce the reliability of the cells because of the residual stress caused by the different thermal expansion coefficients of the materials. Moreover, solar irradiation generates temperature distribution across the surface of the solar cell, and the development of solar cells made of thinner crystalline silicon wafers will lead to the reduction in manufacturing costs. In this study, Finite element analysis (FEA) of the manufacturing process has been carried out using both solder and CF bonding. Three temperature cycles were applied to analyze different environmental operating conditions and understand how thermal cycles affect the residual stress during actual service conditions. This investigation provides a comparison of thermal deformations between solder and CF bonded solar cells in order to understand which offers substantial reliability in the long term. Also this study explores the effects of various thicknesses of the silicon wafer on the residual stress and deformation of the solar cells. |
| Rights: | The final publication is available at link.springer.com |
| Type: | article (author version) |
| URI: | http://hdl.handle.net/2115/66344 |
| Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 佐々木 克彦
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