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Estimating the dopant distribution in Ca-doped alpha-SiAlON: statistical HAADF-STEM analysis and large-scale atomic modeling
Title: | Estimating the dopant distribution in Ca-doped alpha-SiAlON: statistical HAADF-STEM analysis and large-scale atomic modeling |
Authors: | Sakaguchi, Norihito Browse this author →KAKEN DB | Yamaki, Fuuta Browse this author | Saito, Genki Browse this author →KAKEN DB | Kunisada, Yuji Browse this author →KAKEN DB |
Keywords: | alpha-SiAlON | HAADF-STEM | multi-slice simulation | electron channeling | Monte Carlo simulation | dopant distribution |
Issue Date: | Oct-2016 |
Publisher: | Oxford University Press |
Journal Title: | Microscopy |
Volume: | 65 |
Issue: | 5 |
Start Page: | 400 |
End Page: | 406 |
Publisher DOI: | 10.1093/jmicro/dfw020 |
PMID: | 27334599 |
Abstract: | We investigated the dopant distribution in Ca-doped alpha-SiAlON by using high-angle annular dark-field scanning transmission electron microscopy and a multi-slice image simulation. Our results showed that the electron wave propagated by hopping to adjacent Si(Al) and N(O) columns. The image intensities of the Ca columns had wider dispersions than other columns. To estimate the Ca distribution in the bulk material, we performed a Monte Carlo atomic simulation of the alpha-SiAlON with Ca dopants. A model including a short-range Coulomb-like repulsive force between adjacent Ca atoms reproduced the dispersion of the intensity distribution of the Ca column in the experimental image. |
Rights: | This is a pre-copyedited, author-produced version of an article accepted for publication in Microscopy following peer review. The version of record Microscopy (2016) 65(5): 400-406. is available online at: http://dx.doi.org/10.1093/jmicro/dfw020. |
Type: | article (author version) |
URI: | http://hdl.handle.net/2115/67213 |
Appears in Collections: | エネルギー・マテリアル融合領域研究センター (Center for Advanced Research of Energy and Material) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 坂口 紀史
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